TY  - RPRT
TI  - Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
AU  - Zheng Zhang
AU  - Tarek A. El-Moselhy
AU  - Ibrahim
AU  - M. Elfadel
AU  - Luca Daniel
PY  - 2014
DO  - 10.1109/tcad.2013.2263039
UR  - https://arxiv.org/abs/1409.4831
ID  - 1409.4831
ER  -