@misc{indiciae38ad90c696a5,
  title = {Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M = Ru, Os and Fe) by means of bulk-sensitive hard x-ray photoelectron spectroscopy},
  author = {F. Strigari and M. Sundermann and Y. Muro and K. Yutani and T. Takabatake and K. -D. Tsuei and Y. F. Liao and A. Tanaka and P. Thalmeier and M. W. Haverkort and L. H. Tjeng and A. Severing},
  year = {2015},
  doi = {10.1016/j.elspec.2015.01.004},
  url = {https://arxiv.org/abs/1409.6552},
  note = {Source identifier: 1409.6552}
}