@misc{indiciae1eb96ec99948,
  title = {Characterization of Interface Traps in SiO\$\_2\$/SiC Structures Close to the Conduction Band by Deep-Level Transient Spectroscopy},
  author = {Tetsuo Hatakeyama and Mitsuru Sometani and Yoshiyuki Yonezawa and Kenji Fukuda and Hajime Okumura and Tsunenobu Kimoto},
  year = {2014},
  doi = {10.7567/jjap.54.111301},
  url = {https://arxiv.org/abs/1409.7170},
  note = {Source identifier: 1409.7170}
}