TY  - RPRT
TI  - Characterization of Interface Traps in SiO$_2$/SiC Structures Close to the Conduction Band by Deep-Level Transient Spectroscopy
AU  - Tetsuo Hatakeyama
AU  - Mitsuru Sometani
AU  - Yoshiyuki Yonezawa
AU  - Kenji Fukuda
AU  - Hajime Okumura
AU  - Tsunenobu Kimoto
PY  - 2014
DO  - 10.7567/jjap.54.111301
UR  - https://arxiv.org/abs/1409.7170
ID  - 1409.7170
ER  -