@misc{indiciaea4dc768dd918,
  title = {A versatile LabVIEW and FPGA-based scanned probe microscope for in-operando electronic device characterization},
  author = {Andrew J. Berger and Michael R. Page and Jan Jacob and Justin R. Young and Jim Lewis and Lothar Wenzel and Vidya P. Bhallamudi and Ezekiel Johnston-Halperin and Denis V. Pelekhov and P. Chris Hammel},
  year = {2014},
  doi = {10.1063/1.4902934},
  url = {https://arxiv.org/abs/1410.0577},
  note = {Source identifier: 1410.0577}
}