TY  - RPRT
TI  - Temperature Dependent Behavior of Thermal Conductivity of Sub-5 nm Ir film: Defect-electron Scattering Quantified by Residual Thermal Resistivity
AU  - Zhe Cheng
AU  - Zaoli Xu
AU  - Shen Xu
AU  - Xinwei Wang
PY  - 2014
DO  - 10.1063/1.4905607
UR  - https://arxiv.org/abs/1410.0737
ID  - 1410.0737
ER  -