TY  - RPRT
TI  - Thickness Scaling Effect on Interfacial Barrier and Electrical Contact to Two-Dimensional MoS2 Layers
AU  - Song-Lin Li
AU  - K. Komatsu
AU  - Shu Nakaharai
AU  - Yen-Fu Lin
AU  - M. Yamamoto
AU  - X. F. Duan
AU  - K. Tsukagoshi
PY  - 2015
DO  - 10.1021/nn506138y
UR  - https://arxiv.org/abs/1410.1943
ID  - 1410.1943
ER  -