TY  - RPRT
TI  - Perfect light trapping in nanoscale thickness semiconductor films with resonant back reflector and spectrum-splitting structures
AU  - Jiang-Tao Liu
AU  - Xin-Hua Deng
AU  - Wen Yang
AU  - Jun Li
PY  - 2014
DO  - 10.1039/c4cp04717f
UR  - https://arxiv.org/abs/1410.2160
ID  - 1410.2160
ER  -