TY  - RPRT
TI  - Extraction of the Schottky parameters in metal-semiconductor-metal diodes from a single current-voltage measurement
AU  - Ryo Nouchi
PY  - 2014
DO  - 10.1063/1.4901467
UR  - https://arxiv.org/abs/1411.3774
ID  - 1411.3774
ER  -