@misc{indiciaef480dbb41a0e,
  title = {Microstructural Evolution of Charged Defects in the Fatigue Process of Polycrystalline BiFeO3 Thin Films},
  author = {Qingqing Ke and Amit Kumar and Xiaojie Lou and Yuan Ping Feng and Kaiyang Zeng and Yongqing Cai and John Wang},
  year = {2014},
  url = {https://arxiv.org/abs/1412.2313},
  note = {Source identifier: 1412.2313}
}