TY  - RPRT
TI  - Microstructural Evolution of Charged Defects in the Fatigue Process of Polycrystalline BiFeO3 Thin Films
AU  - Qingqing Ke
AU  - Amit Kumar
AU  - Xiaojie Lou
AU  - Yuan Ping Feng
AU  - Kaiyang Zeng
AU  - Yongqing Cai
AU  - John Wang
PY  - 2014
UR  - https://arxiv.org/abs/1412.2313
ID  - 1412.2313
ER  -