@misc{indiciae9f245893e44a,
  title = {In-Situ Measurements of the Secondary Electron Yield in an Accelerator Environment: Instrumentation and Methods},
  author = {W. H. Hartung and D. M. Asner and J. V. Conway and C. A. Dennett and S. Greenwald and J. -S. Kim and Y. Li and T. P. Moore and V. Omanovic and M. A. Palmer and C. R. Strohman},
  year = {2014},
  doi = {10.1016/j.nima.2015.01.092},
  url = {https://arxiv.org/abs/1412.3477},
  note = {Source identifier: 1412.3477}
}