TY  - RPRT
TI  - Current through a multi-lead junction caused by applied bias with arbitrary time-dependence
AU  - Michael Ridley
AU  - Angus MacKinnon
AU  - Lev Kantorovich
PY  - 2014
UR  - https://arxiv.org/abs/1412.4118
ID  - 1412.4118
ER  -