TY  - RPRT
TI  - Silicon MOS Pixel Based on the Deep Trapping Gate Principle: Design and Material Science Challenges
AU  - Nicolas T. Fourches
AU  - G. Regula
AU  - W. Vervisch
PY  - 2016
UR  - https://arxiv.org/abs/1412.8043
ID  - 1412.8043
ER  -