@misc{indiciaede75c43e6029,
  title = {Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC},
  author = {P. Xu and D. Qi and J. K. Schoelz and J. Thompson and P. M. Thibado and V. D. Wheeler and L. O. Nyakiti and R. L. Myers-Ward and C. R. Eddy Jr. and D. K. Gaskill and M. Neek-Amal and F. M. Peeters},
  year = {2014},
  url = {https://arxiv.org/abs/1412.8680},
  note = {Source identifier: 1412.8680}
}