TY  - RPRT
TI  - Self-consistent iteration procedure in analyzing reflectivity and spectroscopic ellipsometry data of multilayered materials and their interfaces
AU  - Teguh Citra Asmara
AU  - Iman Santoso
AU  - Andrivo Rusydi
PY  - 2015
DO  - 10.1063/1.4897487
UR  - https://arxiv.org/abs/1501.00368
ID  - 1501.00368
ER  -