@misc{indiciae228d598ad083,
  title = {Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity},
  author = {M. Zwiebler and J. E. Hamann-Borrero and M. Vafaee and P. Komissinskiy and S. Macke and R. Sutarto and F. He and B. Büchner and G. A. Sawatzky and L. Alff and J. Geck},
  year = {2015},
  doi = {10.1088/1367-2630/17/8/083046},
  url = {https://arxiv.org/abs/1501.03388},
  note = {Source identifier: 1501.03388}
}