TY  - RPRT
TI  - The Vacancy Effect on Thermal Interface Resistance between Aluminum and Silicon by Molecular Dynamics
AU  - Yingying Zhang
AU  - Xin Qian
AU  - Zhan Peng
AU  - Nuo Yang
PY  - 2015
UR  - https://arxiv.org/abs/1501.06666
ID  - 1501.06666
ER  -