TY  - RPRT
TI  - Is the second harmonic method applicable for thin films mechanical properties characterization by nanoindentation? Is the second harmonic method applicable for thin films mechanical properties characterization by nanoindentation?
AU  - G Guillonneau
AU  - G Kermouche
AU  - J Teisseire
AU  - E Barthel
AU  - S Bec
AU  - J. -L Loubet
PY  - 2015
DO  - 10.1080/14786435.2015.1013517
UR  - https://arxiv.org/abs/1502.00379
ID  - 1502.00379
ER  -