@misc{indiciaecc5bb74066d1,
  title = {In-situ spectroscopy of intrinsic Bi2Te3 topological insulator thin films and impact of extrinsic defects},
  author = {P. Ngabonziza and R. Heimbuch and N. de Jong and R. A. Klaassen and M. P. Stehno and M. Snelder and A. Solmaz and S. V. Ramankutty and E. Frantzeskakis and E. van Heumen and G. Koster and M. S. Golden and H. J. W. Zandvliet and A. Brinkman},
  year = {2015},
  doi = {10.1103/physrevb.92.035405},
  url = {https://arxiv.org/abs/1502.01185},
  note = {Source identifier: 1502.01185}
}