TY  - RPRT
TI  - Stability and Migration of Small Copper Clusters in Amorphous Dielectrics
AU  - David M. Guzman
AU  - Nicolas Onofrio
AU  - Alejandro Strachan
PY  - 2015
DO  - 10.1063/1.4921059
UR  - https://arxiv.org/abs/1502.07031
ID  - 1502.07031
ER  -