@misc{indiciae8ec188883dec,
  title = {Measuring Technological Distance for Patent Mapping},
  author = {Bowen Yan and Jianxi Luo},
  year = {2015},
  doi = {10.1002/asi.23664},
  url = {https://arxiv.org/abs/1503.02373},
  note = {Source identifier: 1503.02373}
}