@misc{indiciae1c019384bf6c,
  title = {Atomic origin of high temperature electron trapping in MOS devices},
  author = {Xiao Shen and Sarit Dhar and Sokrates T. Pantelides},
  year = {2015},
  doi = {10.1063/1.4917528},
  url = {https://arxiv.org/abs/1503.03602},
  note = {Source identifier: 1503.03602}
}