TY  - RPRT
TI  - Atomic origin of high temperature electron trapping in MOS devices
AU  - Xiao Shen
AU  - Sarit Dhar
AU  - Sokrates T. Pantelides
PY  - 2015
DO  - 10.1063/1.4917528
UR  - https://arxiv.org/abs/1503.03602
ID  - 1503.03602
ER  -