@misc{indiciae33686c891d7e,
  title = {Indium Tin Oxide film characterization using the classical Hall effect},
  author = {Laurens Willems van Beveren and Evgeniy Panchenko and Nik Anachi and Lachlan Hyde and Dan Smith and Timothy James and Ann Roberts and Jeffrey McCallum},
  year = {2015},
  doi = {10.1109/commad.2014.7038675},
  url = {https://arxiv.org/abs/1503.03679},
  note = {Source identifier: 1503.03679}
}