@misc{indiciaed073489219a8,
  title = {Measurement of the drift velocities of electrons and holes in high-ohmic <100> silicon},
  author = {Christian Scharf and Robert Klanner},
  year = {2015},
  doi = {10.1016/j.nima.2015.07.057},
  url = {https://arxiv.org/abs/1503.08656},
  note = {Source identifier: 1503.08656}
}