TY  - RPRT
TI  - Measurement of the drift velocities of electrons and holes in high-ohmic <100> silicon
AU  - Christian Scharf
AU  - Robert Klanner
PY  - 2015
DO  - 10.1016/j.nima.2015.07.057
UR  - https://arxiv.org/abs/1503.08656
ID  - 1503.08656
ER  -