@misc{indiciaeae686f504af6,
  title = {Remote Surface Roughness Scattering in FDSOI devices with high-\$κ\$/SiO\$\_2\$ gate stacks},
  author = {Y. M. Niquet and I. Duchemin and V. -H. Nguyen and F. Triozon and D. Rideau},
  year = {2015},
  doi = {10.1063/1.4906199},
  url = {https://arxiv.org/abs/1504.01881},
  note = {Source identifier: 1504.01881}
}