TY  - RPRT
TI  - Remote Surface Roughness Scattering in FDSOI devices with high-$κ$/SiO$_2$ gate stacks
AU  - Y. M. Niquet
AU  - I. Duchemin
AU  - V. -H. Nguyen
AU  - F. Triozon
AU  - D. Rideau
PY  - 2015
DO  - 10.1063/1.4906199
UR  - https://arxiv.org/abs/1504.01881
ID  - 1504.01881
ER  -