@misc{indiciae8da5dc0e234c,
  title = {Characterizing the effects of free carriers in fully-etched, dielectric-clad silicon waveguides},
  author = {Rajat Sharma and Matthew W. Puckett and Hung-Hsi Lin and Felipe Vallini and Yeshaiahu Fainman},
  year = {2015},
  doi = {10.1063/1.4922734},
  url = {https://arxiv.org/abs/1504.03064},
  note = {Source identifier: 1504.03064}
}