TY  - RPRT
TI  - Characterizing the effects of free carriers in fully-etched, dielectric-clad silicon waveguides
AU  - Rajat Sharma
AU  - Matthew W. Puckett
AU  - Hung-Hsi Lin
AU  - Felipe Vallini
AU  - Yeshaiahu Fainman
PY  - 2015
DO  - 10.1063/1.4922734
UR  - https://arxiv.org/abs/1504.03064
ID  - 1504.03064
ER  -