@misc{indiciaebb81e5138437,
  title = {The effect of heavy metal in CMOS on neutron induced single event upset simulated with Geant4},
  author = {Huan Zhang and Si-guang Wang and Wei Chen and Shan-chao Yang},
  year = {2015},
  url = {https://arxiv.org/abs/1505.00852},
  note = {Source identifier: 1505.00852}
}