TY  - RPRT
TI  - The effect of heavy metal in CMOS on neutron induced single event upset simulated with Geant4
AU  - Huan Zhang
AU  - Si-guang Wang
AU  - Wei Chen
AU  - Shan-chao Yang
PY  - 2015
UR  - https://arxiv.org/abs/1505.00852
ID  - 1505.00852
ER  -