TY  - RPRT
TI  - Multilayer C2N: Effect of Stacking Order and Number of Layers on Bandgap and Its Controlled Electronic Properties by External Electric Field
AU  - Ruiqi Zhang
AU  - Bin Li
AU  - Jinlong Yang
PY  - 2015
UR  - https://arxiv.org/abs/1505.02584
ID  - 1505.02584
ER  -