TY  - RPRT
TI  - Non-Arrhenius conduction due to the interface-trap-induced disorder in X-doped amorphous InXZnO thin-film transistors
AU  - Mohammed Benwadih
AU  - J. A. Chroboczek
AU  - Gerard Ghibaudo
AU  - Romain Coppard
AU  - Dominique Vuillaume
PY  - 2015
DO  - 10.1063/1.4907681
UR  - https://arxiv.org/abs/1505.04291
ID  - 1505.04291
ER  -