TY  - RPRT
TI  - Interfacial Coupling and Electronic Structure of Two-Dimensional Silicon Grown on the Ag(111) Surface at High Temperature
AU  - Jiagui Feng
AU  - Sean Wagner
AU  - Pengpeng Zhang
PY  - 2015
DO  - 10.1038/srep10310
UR  - https://arxiv.org/abs/1505.06111
ID  - 1505.06111
ER  -