@misc{indiciae38f96e0f07bb,
  title = {General Geometric Fluctuation Modeling for Device Variability Analysis},
  author = {Bo Fu and Seonghoon Jin and Woosung Choi and Keun-Ho Lee and Young-Kwan Park},
  year = {2015},
  doi = {10.1109/ted.2015.2480013},
  url = {https://arxiv.org/abs/1506.00964},
  note = {Source identifier: 1506.00964}
}