TY  - RPRT
TI  - General Geometric Fluctuation Modeling for Device Variability Analysis
AU  - Bo Fu
AU  - Seonghoon Jin
AU  - Woosung Choi
AU  - Keun-Ho Lee
AU  - Young-Kwan Park
PY  - 2015
DO  - 10.1109/ted.2015.2480013
UR  - https://arxiv.org/abs/1506.00964
ID  - 1506.00964
ER  -