TY  - RPRT
TI  - Topological characterization of antireflective and hydrophobic rough surfaces: are random process theory and fractal modeling applicable?
AU  - Claudia Borri
AU  - Marco Paggi
PY  - 2015
DO  - 10.1088/0022-3727/48/4/045301
UR  - https://arxiv.org/abs/1506.06978
ID  - 1506.06978
ER  -