TY  - RPRT
TI  - Electrical and Thermal Transport of Layered Bismuth-chalcogenide EuBiS2F at temperatures between 300 and 623 K
AU  - Yosuke Goto
AU  - Joe Kajitani
AU  - Yoshikazu Mizuguchi
AU  - Yoichi Kamihara
AU  - Masanori Matoba
PY  - 2018
DO  - 10.7566/jpsj.84.085003
UR  - https://arxiv.org/abs/1506.07340
ID  - 1506.07340
ER  -