TY  - RPRT
TI  - Characterizing the Structure of Topological Insulator Thin Films
AU  - Anthony Richardella
AU  - Abhinav Kandala
AU  - Joon Sue Lee
AU  - Nitin Samarth
PY  - 2015
DO  - 10.1063/1.4926455
UR  - https://arxiv.org/abs/1506.08175
ID  - 1506.08175
ER  -