@misc{indiciae3173fbf1a86c,
  title = {X-ray Radiation Hardness of Fully-Depleted SOI MOSFETs and Its Improvement},
  author = {Ikuo Kurachi and Kazuo Kobayashi and Hiroki Kasai and Marie Mochizuki and Masao Okihara and Takaki Hatsui and Kazuhiko Hara and Yasuo Arai},
  year = {2015},
  url = {https://arxiv.org/abs/1506.08510},
  note = {Source identifier: 1506.08510}
}