TY  - RPRT
TI  - X-ray Radiation Hardness of Fully-Depleted SOI MOSFETs and Its Improvement
AU  - Ikuo Kurachi
AU  - Kazuo Kobayashi
AU  - Hiroki Kasai
AU  - Marie Mochizuki
AU  - Masao Okihara
AU  - Takaki Hatsui
AU  - Kazuhiko Hara
AU  - Yasuo Arai
PY  - 2015
UR  - https://arxiv.org/abs/1506.08510
ID  - 1506.08510
ER  -