TY  - RPRT
TI  - Evidence for defect-mediated tunneling in hexagonal boron nitride-based junctions
AU  - U. Chandni
AU  - K. Watanabe
AU  - T. Taniguchi
AU  - J. P. Eisenstein
PY  - 2015
DO  - 10.1021/acs.nanolett.5b02625
UR  - https://arxiv.org/abs/1507.01058
ID  - 1507.01058
ER  -