@misc{indiciaedc4cc17601f4,
  title = {The Effect of Polar Fluctuation and Lattice Mismatch on Carrier Mobility at Oxide Interfaces},
  author = {Z. Huang and K. Han and S. W. Zeng and M. Motapothula and W. M. Lü and C. J. Li and W. X. Zhou and J. M. D. Coey and T. Venkatesan and Ariando},
  year = {2015},
  doi = {10.1021/acs.nanolett.5b04814},
  url = {https://arxiv.org/abs/1507.01675},
  note = {Source identifier: 1507.01675}
}