TY  - RPRT
TI  - Trapped ion scaling with pulsed fast gates
AU  - C. D. B. Bentley
AU  - A. R. R. Carvalho
AU  - J. J. Hope
PY  - 2016
DO  - 10.1088/1367-2630/17/10/103025
UR  - https://arxiv.org/abs/1507.02783
ID  - 1507.02783
ER  -