@misc{indiciae717a1a3a99d3,
  title = {Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition},
  author = {Jeffrey G. Ulbrandt and Meliha G. Rainville and Christa Hoskin and Suresh Narayanan and Alec R. Sandy and Hua Zhou and Karl F. Ludwig Jr. and Randall L. Headrick},
  year = {2015},
  url = {https://arxiv.org/abs/1507.03694},
  note = {Source identifier: 1507.03694}
}