TY  - RPRT
TI  - Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition
AU  - Jeffrey G. Ulbrandt
AU  - Meliha G. Rainville
AU  - Christa Hoskin
AU  - Suresh Narayanan
AU  - Alec R. Sandy
AU  - Hua Zhou
AU  - Karl F. Ludwig Jr.
AU  - Randall L. Headrick
PY  - 2015
UR  - https://arxiv.org/abs/1507.03694
ID  - 1507.03694
ER  -