TY  - RPRT
TI  - Three-Dimensional Interface Roughness in Layered Semiconductor Structures and Its Effects on Intersubband Transitions
AU  - Alex Y. Song
AU  - Rajaram Bhat
AU  - Pierre Bouzi
AU  - Chung-En Zah
AU  - Claire F. Gmachl
PY  - 2015
DO  - 10.1103/physrevb.94.165307
UR  - https://arxiv.org/abs/1507.06016
ID  - 1507.06016
ER  -