TY  - RPRT
TI  - Modeling of strain-induced Pockels effect in Silicon
AU  - Costanza Lucia Manganelli
AU  - Paolo Pintus
AU  - Claudio Bonati
PY  - 2016
DO  - 10.1364/oe.23.028649
UR  - https://arxiv.org/abs/1507.06589
ID  - 1507.06589
ER  -